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DIAMOND 40
Enhanced multi-site production IC test system
Is ideal for testing very cost-sensitive IC devices such as wireless baseband, microcontrollers, display controllers, RF SIP devices, Bluetooth™ devices, and integrated wireless transceivers used in popular consumer electronic products.
Analog, Digital, Mixed Signal, RF
The Diamond™ 40 test system combines analog, digital, mixed signal, and RF test instrumentation to support a wide range of consumer IC device testing. Incorporating Credence's proprietary MVNA™ (Modulated Vector Network Analysis) technology, the Diamond 40 adds wireless test capabilities for mobile phone, WLAN, WiMAX and ZigBee devices.
Offering from 10 to up to 40 slots, the Diamond 40 supports over 3000 pins for very large ASIC testing, or massive multi-site test requirements (>16 sites). The Diamond 40 can expand in 10 slot increments ensuring a match of system capability to your test requirements
The Diamond 40 leverages the common instrument suite and software available in the Diamond series.
- Expands on our award-winning Diamond 10 performance: The Diamond 40 uses the identical software suite and is compatible with all of the Diamond 10 instruments. In addition, the Diamond 40 expands on the Diamond 10 capabilities by:
- adding RF testing of wireless mobile phone, EDGE, WLAN, WiMAX, and other consumer electronics products and standards; and
- delivering up to four times the capability of the Diamond 10. The Diamond 40 offers up to 40 instrument slots, enabling the system to scale as your testing needs increase. Diamond 40 supports well over 3000 pins to address even the most demanding multi-site applications.
- Patented MVNA™ RF technology delivers superior measurement accuracy and extremely short test times: The Diamond 40 provides RF test functionality for a wide variety of wireless devices through 6 GHz. It includes 16 RF I/O ports with an integrated per-receiver DSP architecture that delivers unprecedented test times in multi-site applications. Credence's MVNA (Modulated Vector Network Analysis) RF architecture integrates key technologies - distributed signal processing, encapsulated measurement algorithms, and high-performance, front-end electronics - to deliver superior RF measurement accuracy with extremely short test times.
- Modular architecture is economically scalable to your environment The Diamond 40 modules expand in increments of 10 slots allowing the tester infrastructure to scale to the task. This minimizes the "zero pin count" cost of the system and delivers maximum economic benefit regardless of the number of sites being tested - from one to many.
An ultra-compact, air-cooled IC test system ideal for testing ICs in modern consumer electronic devices such as digital cameras, cell phones, PDAs, and toys and games
- 10 to 40 interchangeable instrument slots, upgradeable in 10-slot increments, enables the Diamond 40 to scale easily
- High-density technology provides greater than 3000 pins
- Instruments for the Diamond 40 use a blend of proprietary ASIC technology for high performance and density melded with FPGA technology to deliver instrument reconfigurability and expansion
- MVNA™ RF measurement option supports 16 ports for x4 and x8 wireless testing ushering in a new level of test cost reduction
- Industry standard cPCI backplane architecture allows 3rd party instruments without the need for expensive board adapters
- High throughput architecture–The high-speed switched network moves data at rates up to 500 megabits per second (Mb/s) to minimize test times, especially for those devices that require extensive data capture, transport, and processing.
- Software–The Diamond 40 comes with a full suite of intuitive software tools for test creation, debug, characterization, and high-volume production.
- Uses industry-standard languages: Standard Test Interface Language (STIL) for pattern data, and C++;
- Easy third-party instrument integration is provided to accommodate any special test requirements through te use of a cPCI backplane;
- The programming interface uses C++ and high-level graphical interfaces on a Linux operating system (OS);
- An open architecture allows for easy access to low-level code, if additional custom software is desired;
- Facilitates communication between design and test with electronic design automation (EDA) links, the use of STIL pattern formats;
- Easily accomplish debug and characterization with the Analog Wavetool, Shmoo and Margin tools
- Mixed-Signal Resources–The flexibility and channel density of the Diamond 40 mixed-signal instruments are also noteworthy. Each arbitrary waveform generator and digitizer instrument supports four different channels and is user-customizable for high-accuracy or high-frequency operation. These quad-channel, multi-band instruments enable efficient multi-site testing or the testing of ICs with multiple functions.
- Digital Resources–The digital subsystem offers high performance, high pin count solutions (greater than 3000 pins in the Diamond 40) for the digital signals on SoC devices, pattern sequencer execution up to 100 MHz, clock rates up to 200 MHz, and data rates up to 200 Mbps- all across 96-channels per instrument.
- Each digital pin:
- provides parametric functionality;
- has pattern memory of 16 M for drive/compare/hi-Z, and 16 M for data capture. The memory is also reconfigurable for scan data, efficiently packed to use all available storage between parallel and scan memory operations;
 Analog  Mixed Signal  Digital  RF
VIS16 VOLTAGE/CURRENT SOURCE
Debug. Characterization. Production Test. A sixteen-channel, four-quadrant voltage/current (V/I) source and measure instrument (VIS16) with a voltage range of ±60 V and a current source of ± 300 mA per channel. The Diamond VIS16 delivers more performance from DC resources than is possible with a device power supply or PMU. This capability makes the instrument ideal for applications in microcontroller, wireless baseband, display driver and wafer sort applications.
 Download Datasheet (PDF)
DPS16
Debug. Characterization. Production Test. This device power supply is a high-performance 16-channel power supply card. The 16 channels available can supply up to 2A over a 0 to 6 volt range and up to 16A in a ganged arrangement. This multi-channel power supply facilitates multi-site testing of devices.
Download Datasheet (PDF)
MultiWave
Debug. Characterization. Production Test. Four wide bandwidth generator channels and four wide bandwidth digitizer channels are integrated into a single board. The multi-channel arbitrary waveform generator and digitizer unit enables high performance mixed signal tests covering a full spectrum of SoC/SiP applications, including high precision audio, high speed video, automotive, etc. In addition to the converter path, every I/O channel has a separate high precision Kelvin PMU for parallel DC parametric tests. A flexible trigger routing with 10 trigger inputs and 10 trigger outputs per instrument allows event synchronization to other system components.
Download Datasheet (PDF)
DD1096/DD1096-32
Debug. Characterization. Production Test. The DD1096-16 instrument provides full digital performance in a compact size at a very low price. The 200 Mbps pincard features 96 digital channels, each with 256 timesets, 256 format sets, per-pin-PMUs, 12 V super voltage, and per-pin drive and compare levels. Reconfigurable vector memory and an agile pattern sequencer bring flexibility to functional testing.
Download Datasheet (PDF)
MIXED-SIGNAL ARBITRARY WAVEFORM GENERATOR (AWG)
Debug. Characterization. Production Test. A multi-site, mixed-signal Arbitrary Waveform Generator (AWG). The Credence AWG supports four differential channels capable of either high-accuracy or high-frequency operation, programmable on-the-fly. The AWG may be configured for either four differential channels or eight single-ended channels, making it perfect for multi-site or multi-port testing. It has quad differential audio source and capture capabilities focused on obtaining the dynamic results for ADC in device.
Download Datasheet (PDF)
MIXED-SIGNAL DIGITIZER (DIG)
Debug. Characterization. Production Test. A multi-band, multi-channel digitizer for multi-site test. The Credence Mixed-Signal Digitizer (DIG) is ideally suited for audio, video, and baseband multi-site device testing. The DIG offers both low-frequency and high frequency performance in one instrument. Four differential channels, each with its own acquisition module, provide maximum throughput and flexibility for multi-site or multi-port testing.
Download Datasheet (PDF)
MVNA™ RF16
Debug. Characterization. Production Test. Credence's RF measurement option for the Diamond 40 includes 16 ports along with an integrated per-receiver DSP architecture that delivers fast test times in multi-site applications with full RF test capabilities for a wide range of wireless devices up to 6 GHz in frequency. When combined with various digital, mixed-signal, and analog instrument options, the MVNA RF measurement option allows the testing of highly integrated mobile phone devices, WLAN ICs, and virtually any RFIC.
Download Datasheet (PDF)
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