DIAMOND 10
IC test system for engineering, wafer sort, and final test environments

• Specifically designed for the test challenges of low-cost consumer IC devices: The Diamond digital system delivers 100 Mhz data performance with 96 channels per board for high pin count devices, or massive multi-site test. Today's feature-rich electronic devices require precision analog and mixed-signal capabilities. The Diamond 10 allows for testing of regulators or embedded A/D converters common in today's consumer devices and addresses the audio and video interfaces common in consumer electronics.
• High throughput reduces test times for consumer IC devices: The high-speed switched network moves data at rates up to 500 megabits per second (Mb/s), minimizing test times, especially for consumer devices that require extensive data capture, transport, and processing.
• Modular architecture is economically scalable to your environment: The ultra-compact D-10 modular architecture scales from desktop debug and characterization to high volume multi-site production on the same system, a concept pioneered by Credence. Cooling, power, and even mechanical infrastructure can easily grow as your needs grow. It is air-cooled to minimize HVAC requirements, and most configurations use a standard 110V or 220V outlet .

An ultra-compact, air-cooled IC test system ideal for testing ICs in modern consumer electronic devices such as digital cameras, cell phones, PDAs, and toys and games

• Ten instrument slots for digital, mixed-signal, and linear instruments
• Up to 768 200 Mhz digital channels and a mix of high-density analog and mixed-signal instruments
• High throughput architecture-the high-speed switched network moves data at rates up to 500 megabits per second (Mb/s), minimizing test times, especially for devices that require extensive data capture, transport, and processing.
• Software-The Diamond 10 comes with a full suite of intuitive software tools for test creation, debug, characterization, and high-volume production:
  • Uses industry-standard languages: Standard Test Interface Language (STIL) for pattern data, and C++.
  • Easy third-party instrument integration is provided to accommodate any special test requirements through the use of a cPCI backplane.
  • The programming interface uses C++ and high-level graphical interfaces on a Linux operating system (OS).
  • An open architecture allows for easy access to low-level code for additional custom software, as desired.
  • Facilitate communication between design and test with electronic design automation (EDA) links, the use of STIL pattern formats
  • Easily accomplish debug and characterization with the Analog Wavetool, Shmoo and Margin tools.
• Mixed-Signal Resources-The flexibility and channel density of the Diamond 10 mixed-signal instruments are also notable. Each arbitrary waveform generator and digitizer instrument supports four different channels and is user-customizable for high-accuracy or high-frequency operation. These quad-channel, multi-band instruments enable efficient multi-site testing or the testing of ICs with multiple functions.
• Digital Resources-The digital subsystem offers high performance, high pin count solutions for the digital signals on SoC devices, pattern sequencer execution up to 100 MHz, clock rates up to 200 MHz, and data rates up to 200 Mbps-all across 96-channels per instrument.
• Each digital pin:
  • provides parametric functionality;
  • has pattern memory of 16 or 32 M for drive/compare/hi-Z, and 16 M for data capture. The memory may be reconfigured to be used as scan data, efficiently packed to use all available storage between parallel and scan memory operations.
• 16 channel V/I instrument supporting up to o ± 60V, and up to ± 300 mA

Analog   Mixed Signal   Digital   RF

VIS16
DPS16
MultiWave
DD1096
AWG
DIG
RF16

VIS16 VOLTAGE/CURRENT SOURCE

Debug. Characterization. Production Test. A sixteen-channel, four-quadrant voltage/current (V/I) source and measure instrument (VIS16) with a voltage range of ±60 V and a current source of ± 300 mA per channel. The Diamond VIS16 delivers more performance from DC resources than is possible with a device power supply or PMU. This capability makes the instrument ideal for applications in microcontroller, wireless baseband, display driver and wafer sort applications.

  Download Datasheet (PDF)

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DPS16

Debug. Characterization. Production Test. This device power supply is a high-performance 16-channel power supply card. The 16 channels available can supply up to 2A over a 0 to 6 volt range and up to 16A in a ganged arrangement. This multi-channel power supply facilitates multi-site testing of devices.

  Download Datasheet (PDF)

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MultiWave

Debug. Characterization. Production Test. Four wide bandwidth generator channels and four wide bandwidth digitizer channels are integrated into a single board. The multi-channel arbitrary waveform generator and digitizer unit enables high performance mixed signal tests covering a full spectrum of SoC/SiP applications, including high precision audio, high speed video, automotive, etc. In addition to the converter path, every I/O channel has a separate high precision Kelvin PMU for parallel DC parametric tests. A flexible trigger routing with 10 trigger inputs and 10 trigger outputs per instrument allows event synchronization to other system components.

  Download Datasheet (PDF)

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DD1096/DD1096-32

Debug. Characterization. Production Test. The DD1096-16 instrument provides full digital performance in a compact size at a very low price. The 100 Mhz pincard features 96 digital channels, each with 256 timesets, 256 format sets, per-pin-PMUs, 12 V super voltage, and per-pin drive and compare levels. Reconfigurable vector memory and an agile pattern sequencer bring flexibility to functional testing.

  Download Datasheet (PDF)

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MIXED-SIGNAL ARBITRARY WAVEFORM GENERATOR (AWG)

Debug. Characterization. Production Test. A multi-site, mixed-signal Arbitrary Waveform Generator (AWG). The Credence AWG supports four differential channels capable of either high-accuracy or high-frequency operation, programmable on-the-fly. The AWG may be configured for either four differential channels or eight single-ended channels, making it perfect for multi-site or multi-port testing. It has quad differential audio source and capture capabilities focused on obtaining the dynamic results for ADC in device.

  Download Datasheet (PDF)

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MIXED-SIGNAL DIGITIZER (DIG)

Debug. Characterization. Production Test. A multi-band, multi-channel digitizer for multi-site test. The Credence Mixed-Signal Digitizer (DIG) is ideally suited for audio, video, and baseband multi-site device testing. The DIG offers both low-frequency and high frequency performance in one instrument. Four differential channels, each with its own acquisition module, provide maximum throughput and flexibility for multi-site or multi-port testing.

  Download Datasheet (PDF)

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MVNA™ RF16

Debug. Characterization. Production Test. Credence's RF measurement option for the Diamond 40 includes 16 ports along with an integrated per-receiver DSP architecture that delivers fast test times in multi-site applications with full RF test capabilities for a wide range of wireless devices up to 6 GHz in frequency. When combined with various digital, mixed-signal, and analog instrument options, the MVNA RF measurement option allows the testing of highly integrated mobile phone devices, WLAN ICs, and virtually any RFIC. Available only for the D40.

  Download Datasheet (PDF)

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